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IHEP 2013 - 24 (In Russian) | |
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A.P.Vorob'ev, S.N.Golovnya,
S.A.Gorokhov, I.S.Lobanov,
E.B.Lobanova, S.Yu.Molodtsova
(IHEP, Protvino, Russia),
D.E.Karmanov, M.M.Merkin
(SINP MSU, Moscow, Russia)
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The quality assurance system for production of semiconductor microstrip
detectors at IHEP
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| Protvino, 2013. – p. 14, figs. 11, refs.: 5. | ||
The quality assurance system for production of the semiconductor microstrip detectors, used as track detectors in experimental installations, created at IHEP. On the exsample of testing of the semiconductor detectors, prodused for modernisation of the SVD setup, the set of procedures used in assurance system is described. The test results of the set number of the detectors, prepared for the SVD setup are presented.
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